Meet KPM Analytics at IPPE, January 28-30 in Atlanta
Meet the KPM food safety and quality experts at Booth C16189 and experience new methods to modernize product inspection. Here's what you'll see at our stand:
- P-Series Vision Inspection System
- SiftAI® FM Foreign Material Detection System
- TheiaVu® WD-300 Wipe-Down Vision Measurement System
- SpectraStar™ XT Benchtop NIR Analyzer
What you can expect when you visit our booth:
- See a Demonstration of New Ways to Modernize Product Inspection Processes
- Discover how AI Aids in Foreign Material Detection & Sorting/Grading Processes
- Tech to Help You Analyze Protein, Moisture, Fat, Fiber, and Other Important QualityParameters
Andy Dambeck
E. adambeck@kpmanalytics.com
T. 774-399-0477